As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://remingtonkyhrq.blgwiki.com/2061178/logic_synthesis_as_the_bridge_between_rtl_design_and_silicon_implementation